Advanced Sorting Technology

Introduction

SP Industrial implements Advanced Sorting Technology (AST) for NAND Flash testing and classification, specifically designed to meet the diverse temperature requirements of industrial customers. This technology precisely evaluates the durability and stability of NAND Flash memory; then accurately classifies it based on rigorous test results. This meticulous process ensures that the classified NAND Flash fully complies with the stringent demands of wide-temperature industrial applications.

AST Testing Flow:

SP Industrial conducts AST testing to classify NAND Flash into three distinct categories. Tests are performed across various temperatures and data transfer rates to ensure consistent performance over a wide temperature range. This rigorous methodology simulates harsh environmental conditions and validates optimal operation at maximum speed for each technological generation.

1. Electrical Testing: This phase checks current, voltage, and short-circuit issues within the NAND Flash to guarantee normal electrical functionality.
2. Functional Testing: Conducts multiple Read, Write, and Erase operations are performed in both SLC and TLC modes to confirm proper device functionality.
3. Error Bit Testing: Records Error Bits during the process and classifies NAND Flash into wide-temperature and normal-temperature categories based on the results.

Only NAND Flash successfully passing rigorous AST testing is integrated into wide-temperature products, guaranteeing the highest quality and stability. This technology precisely grades NAND Flash for diverse applications while significantly enhancing the overall reliability and durability of SP Industrial's products.